Department of Applied Psychology

Research Output 1999 2019

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Review article
2002

The pitfalls of poor psychometric properties : a rejoinder to Hofstede's reply to us

SPECTOR, P. E., COOPER, C. L., SANCHEZ, J. I., SPARKS, K., BÜSSING, A., DEWE, P., LU, L., MILLER, K., DE MORAES, L. R., O'DRISCOLL, M., PAGON, M., PITARIU, H., POELMANS, S., RADHAKRISHNAN, P., SALGADO, J., SIU, O. L., Stora, J. B., Vlerick, P., Westman, M., Widerszal-Bazyl, M. & 1 others, WONG, P., 1 Jan 2002, In : Applied Psychology: An International Review. 51, 1, p. 174-178 5 p.

Research output: Journal PublicationsReview articleBook review

Applied Psychology
Psychometrics
Pitfalls
Surveys and Questionnaires
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