Comparing feature detectors: A bias in the repeatability criteria

Ives REY-OTERO, Mauricio DELBRACIO, Jean-Michel MOREL

Research output: Book Chapters | Papers in Conference ProceedingsConference paper (refereed)Researchpeer-review

14 Citations (Scopus)

Abstract

Most computer vision application rely on algorithms finding local correspondences between different images. These algorithms detect and compare stable local invariant descriptors centered at scale-invariant keypoints. Because of the importance of the problem, new keypoint detectors and descriptors are constantly being proposed, each one claiming to perform better than the preceding ones. This raises the question of a fair comparison between very diverse methods. This evaluation has been mainly based on a repeatability criterion of the keypoints under a series of image perturbations (blur, illumination, noise, rotations, homotheties, homographies, etc). In this paper, we argue that the classic repeatability criterion is biased favoring algorithms producing redundant overlapped detections. We propose a sound variant of the criterion taking into account the descriptor overlap that seems to invalidate some of the community's claims of the last ten years.
Original languageEnglish
Title of host publication2015 IEEE International Conference on Image Processing, ICIP 2015, Proceedings
PublisherIEEE
Pages3024-3028
Number of pages5
ISBN (Electronic)9781479983391
DOIs
Publication statusPublished - 2015
Externally publishedYes
Event2015 IEEE International Conference on Image Processing - Quebec City, Canada
Duration: 27 Sept 201530 Sept 2015

Conference

Conference2015 IEEE International Conference on Image Processing
Country/TerritoryCanada
CityQuebec City
Period27/09/1530/09/15

Keywords

  • Feature detectors
  • performance evaluation

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