Comprehensive Monitoring of Nonlinear Processes Based on Concurrent Kernel Projection to Latent Structures

Ning SHENG, Qiang LIU, S. Joe QIN, Tianyou CHAI

Research output: Journal PublicationsJournal Article (refereed)peer-review

51 Citations (Scopus)

Abstract

Projection to latent structures (PLS) and concurrent PLS are approaches for solving quality-relevant process monitoring. In this paper, a new approach called concurrent kernel PLS (CKPLS) is presented to detect faults comprehensively for nonlinear processes. The new model divides the nonlinear process and quality spaces into five subspaces: the co-varying, process-principal, process-residual, quality-principal, and quality-residual subspaces. The co-varying subspace reflects nonlinear relationship between quality variables and original process variables. The process-principal and process-residual subspaces reflect the principal variations and residuals, respectively, in the nonlinear process space. Further, the quality-principal and quality-residual subspaces reflect the principal variations and residuals, respectively, in the quality space. The proposed approach is demonstrated by a numerical simulation and an application of the Tennessee Eastman process.
Original languageEnglish
Article number7310889
Pages (from-to)1129-1137
Number of pages9
JournalIEEE Transactions on Automation Science and Engineering
Volume13
Issue number2
Early online date28 Oct 2015
DOIs
Publication statusPublished - Apr 2016
Externally publishedYes

Funding

This work was supported in part by the Natural Science Foundation of China under Grant 61304107, Grant 61490704, Grant 61573022, and Grant 61290323, the China Postdoctoral Science Foundation funded project under Grant 2013M541242, the International Postdoctoral Exchange Fellowship Program under Grant 20130020, the Fundamental Research Funds for the Central Universities under Grant N130408002 and N130108001, and the IAPI Fundamental Research Funds under Grant 2013ZCX04 and Grant 2013ZCX05.

Keywords

  • Concurrent kernel projection to latent structures (CKPLS)
  • nonlinear process monitoring
  • process-relevant fault detection
  • quality-relevant fault detection

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