Abstract
Projection to latent structures (PLS) and concurrent PLS are approaches for solving quality-relevant process monitoring. In this paper, a new approach called concurrent kernel PLS (CKPLS) is presented to detect faults comprehensively for nonlinear processes. The new model divides the nonlinear process and quality spaces into five subspaces: the co-varying, process-principal, process-residual, quality-principal, and quality-residual subspaces. The co-varying subspace reflects nonlinear relationship between quality variables and original process variables. The process-principal and process-residual subspaces reflect the principal variations and residuals, respectively, in the nonlinear process space. Further, the quality-principal and quality-residual subspaces reflect the principal variations and residuals, respectively, in the quality space. The proposed approach is demonstrated by a numerical simulation and an application of the Tennessee Eastman process.
Original language | English |
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Article number | 7310889 |
Pages (from-to) | 1129-1137 |
Number of pages | 9 |
Journal | IEEE Transactions on Automation Science and Engineering |
Volume | 13 |
Issue number | 2 |
Early online date | 28 Oct 2015 |
DOIs | |
Publication status | Published - Apr 2016 |
Externally published | Yes |
Keywords
- Concurrent kernel projection to latent structures (CKPLS)
- nonlinear process monitoring
- process-relevant fault detection
- quality-relevant fault detection