Design of microwave near-field microscope analyzer for material chips and Realization of a system

Baoguo YANG, Fushun NIAN*, Yong XIANG, Zhenyu WANG, Lijun ZHAO, Chunqing XU

*Corresponding author for this work

Research output: Book Chapters | Papers in Conference ProceedingsConference paper (refereed)Researchpeer-review

Abstract

In this paper, the technique and test method of microwave near-field microscopy are studied. The microwave circuit unit is integrated, and the microwave near-field microscope analyzer is designed and implemented. The working frequency is 10MHz 40GHz. Then, the calibration method of instrument and system is put forward. The electrical error and mechanical error are calibrated, and the system parameters are corrected. PMMA was used as sample to test and verify. Based on the analyzer, a microwave microscope system with a resolution of 100 nm is realized.

Original languageEnglish
Title of host publication2021 IEEE 6th International Conference on Computer and Communication Systems, ICCCS 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1075-1078
Number of pages4
ISBN (Electronic)9780738126043
DOIs
Publication statusPublished - 23 Apr 2021
Externally publishedYes
Event6th IEEE International Conference on Computer and Communication Systems, ICCCS 2021 - Chengdu, China
Duration: 23 Apr 202126 Apr 2021

Conference

Conference6th IEEE International Conference on Computer and Communication Systems, ICCCS 2021
Country/TerritoryChina
CityChengdu
Period23/04/2126/04/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

Funding

Natural Science Foundation of Anhui Province: 1908085MF220 *Corresponding author

Keywords

  • Dielectric constant
  • microscopy
  • microwave
  • near-field

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