Abstract
In this paper, the technique and test method of microwave near-field microscopy are studied. The microwave circuit unit is integrated, and the microwave near-field microscope analyzer is designed and implemented. The working frequency is 10MHz 40GHz. Then, the calibration method of instrument and system is put forward. The electrical error and mechanical error are calibrated, and the system parameters are corrected. PMMA was used as sample to test and verify. Based on the analyzer, a microwave microscope system with a resolution of 100 nm is realized.
Original language | English |
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Title of host publication | 2021 IEEE 6th International Conference on Computer and Communication Systems, ICCCS 2021 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1075-1078 |
Number of pages | 4 |
ISBN (Electronic) | 9780738126043 |
DOIs | |
Publication status | Published - 23 Apr 2021 |
Externally published | Yes |
Event | 6th IEEE International Conference on Computer and Communication Systems, ICCCS 2021 - Chengdu, China Duration: 23 Apr 2021 → 26 Apr 2021 |
Conference
Conference | 6th IEEE International Conference on Computer and Communication Systems, ICCCS 2021 |
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Country/Territory | China |
City | Chengdu |
Period | 23/04/21 → 26/04/21 |
Bibliographical note
Publisher Copyright:© 2021 IEEE.
Funding
Natural Science Foundation of Anhui Province: 1908085MF220 *Corresponding author
Keywords
- Dielectric constant
- microscopy
- microwave
- near-field