Drug Dosage Adjustment Via Run-To-Run Control

Richard GOOD*, Juergen HAHN, Thomas EDISON, S. Joe QIN

*Corresponding author for this work

Research output: Book Chapters | Papers in Conference ProceedingsConference paper (refereed)Referred Conference Paperpeer-review

7 Citations (Scopus)


Run-to-Run control is often used in the semiconductor manufacturing industry when process measurements are not available in situ and changes in the manipulated variables can only be made between process runs. It is pointed out in this paper that many similarities exist between controlling semiconductor manufacturing and designing an effective long-term drug therapy. Based upon these similarities, a run-to-run control algorithm is designed and its validity is illustrated with a case study on controlling blood coagulation. The simulation compares the effectiveness of an adaptive run-to-run controller with the anticoagulation control algorithms currently being used by physicians for both short-term and long-term changes in the patient's response to medication. The simulation shows that the adaptive run-to-run control algorithm outperforms the conventional control algorithm by keeping the patient within the therapeutic range during both normal drifts in drug tolerance and large disturbances in the patient's response to the medication.
Original languageEnglish
Title of host publicationProceedings of the 2002 American Control Conference
PublisherInstitute of Electrical and Electronics Engineers
Number of pages6
ISBN (Electronic)0780372999
ISBN (Print)0780372980
Publication statusPublished - May 2002
Externally publishedYes
Event2002 American Control Conference (ACC) - Anchorage, United States
Duration: 8 May 200210 May 2002

Publication series

NameProceedings of the American Control Conference
PublisherInstitute of Electrical and Electronics Engineers
ISSN (Print)0743-1619
ISSN (Electronic)2378-5861


Conference2002 American Control Conference (ACC)
Country/TerritoryUnited States


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