Examination of Prestressed Coating/Substrate Systems Using Spherical Indentation-Determination of Film Prestress, Film Modulus, and Substrate Modulus

James A. MILLS, Hang XIAO, Xi CHEN

Research output: Journal PublicationsJournal Article (refereed)peer-review

Abstract

There have been many studies performed with respect to the indentation of thin films affixed to a corresponding substrate base. These studies have primarily focused on determining the mechanical properties of the film. It is the goal of this paper to further understand the role that the film plays and how a potential prestressing of this film has on both the film and substrate base. It is equally important to be able to understand the material properties of the substrate since during manufacturing or long-term use, the substrate properties may change. In this study, we establish through spherical indentation a framework to characterize the material properties of both the substrate and film as well as a method to determine the prestress of the film. It is proposed that through an initial forward analysis, a set of relationships are developed. A single spherical indentation test can then be performed, measuring the indentation force at two prescribed depths, and with the relationships developed from the forward analysis, the material properties of both the film and substrate can be determined. The problem is further enhanced by also developing the capability of determining any equibiaxial stress state that may exist in the film. A generalized error sensitivity analysis of this formulation is also performed systematically. This study will enhance the present knowledge of a typical prestressed film/substrate system as is commonly used in many of today's engineering and technical applications. © 2019 by ASME.
Original languageEnglish
Article number11003
Number of pages11
JournalJournal of Engineering Materials and Technology
Volume142
Issue number1
Early online date17 Jul 2019
DOIs
Publication statusPublished - Jan 2020
Externally publishedYes

Bibliographical note

X. C. acknowledges the support from the National Natural Science Foundation of China (11172231 and 11372241; Funder ID: 10.13039/501100001809), Yonghong Zhang Family Center for Advanced Materials for Energy and Environment, Advanced Research Projects Agency—Energy (DE-AR0000396), and Air Force Office of Scientific Research (FA9550-12-1-0159; Funder ID: 10.13039/100000181).

Keywords

  • elastic property
  • Film prestress
  • indentation
  • substrate
  • thin film

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