Extracting Fault Subspaces for Fault Identification of a Polyester Film Process

Sergio VALLE, Joe J. QIN, Michael J. PIOVOSO, Mike BACHMANN, Nori MANDAKORO

Research output: Book Chapters | Papers in Conference ProceedingsConference paper (refereed)Referred Conference Paperpeer-review

26 Citations (Scopus)

Abstract

Although fault detection has been well studied in process monitoring under stationary conditions, the identification of faults in chemical processes is a difficult task. In this paper, we present a new approach in the use of a fault identification index to identify faults based on fault directions extracted from abnormal data using singular value decomposition. The proposed method is demonstrated on an industrial polyester film process which is characterized by frequent set-point changes and multiple grade changes. Further, a comparison between the fault identification index and the contribution plot method is given.
Original languageEnglish
Title of host publicationProceedings of the 2001 American Control Conference
PublisherInstitute of Electrical and Electronics Engineers
Pages4466-4471
Number of pages6
ISBN (Electronic)078036497X
ISBN (Print)0780364953
DOIs
Publication statusPublished - Jun 2001
Externally publishedYes
Event2001 American Control Conference, ACC 2001 - Arlington, United States
Duration: 25 Jun 200127 Jun 2001

Publication series

NameProceedings of the American Control Conference
PublisherInstitute of Electrical and Electronics Engineers
ISSN (Print)0743-1619
ISSN (Electronic)2378-5861

Conference

Conference2001 American Control Conference, ACC 2001
Country/TerritoryUnited States
CityArlington
Period25/06/0127/06/01

Fingerprint

Dive into the research topics of 'Extracting Fault Subspaces for Fault Identification of a Polyester Film Process'. Together they form a unique fingerprint.

Cite this