Extracting Fault Subspaces for Fault Identification of a Polyester Film Process

Sergio VALLE; Joe J. QIN; Michael J. PIOVOSO; Mike BACHMANN; Nori MANDAKORO

doi:10.1109/ACC.2001.945682

Extracting Fault Subspaces for Fault Identification of a Polyester Film Process

Sergio VALLE
, Joe J. QIN
, Michael J. PIOVOSO
, Mike BACHMANN
, Nori MANDAKORO

Research output: Book Chapters | Papers in Conference Proceedings › Conference paper (refereed) › Referred Conference Paper › peer-review

26 Citations (Scopus)

Abstract

Although fault detection has been well studied in process monitoring under stationary conditions, the identification of faults in chemical processes is a difficult task. In this paper, we present a new approach in the use of a fault identification index to identify faults based on fault directions extracted from abnormal data using singular value decomposition. The proposed method is demonstrated on an industrial polyester film process which is characterized by frequent set-point changes and multiple grade changes. Further, a comparison between the fault identification index and the contribution plot method is given.

Original language	English
Title of host publication	Proceedings of the 2001 American Control Conference
Publisher	Institute of Electrical and Electronics Engineers
Pages	4466-4471
Number of pages	6
ISBN (Electronic)	078036497X
ISBN (Print)	0780364953
DOIs	https://doi.org/10.1109/ACC.2001.945682
Publication status	Published - Jun 2001
Externally published	Yes
Event	2001 American Control Conference, ACC 2001 - Arlington, United States Duration: 25 Jun 2001 → 27 Jun 2001

Publication series

Name	Proceedings of the American Control Conference
Publisher	Institute of Electrical and Electronics Engineers
ISSN (Print)	0743-1619
ISSN (Electronic)	2378-5861

Conference

Conference	2001 American Control Conference, ACC 2001
Country/Territory	United States
City	Arlington
Period	25/06/01 → 27/06/01

Access to Document

10.1109/ACC.2001.945682

Cite this

VALLE, S., QIN, J. J., PIOVOSO, M. J., BACHMANN, M., & MANDAKORO, N. (2001). Extracting Fault Subspaces for Fault Identification of a Polyester Film Process. In Proceedings of the 2001 American Control Conference (pp. 4466-4471). (Proceedings of the American Control Conference). Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/ACC.2001.945682

@inproceedings{d3998933795b4e0b90ec809a19b0651d,

title = "Extracting Fault Subspaces for Fault Identification of a Polyester Film Process",

abstract = "Although fault detection has been well studied in process monitoring under stationary conditions, the identification of faults in chemical processes is a difficult task. In this paper, we present a new approach in the use of a fault identification index to identify faults based on fault directions extracted from abnormal data using singular value decomposition. The proposed method is demonstrated on an industrial polyester film process which is characterized by frequent set-point changes and multiple grade changes. Further, a comparison between the fault identification index and the contribution plot method is given.",

author = "Sergio VALLE and QIN, \{Joe J.\} and PIOVOSO, \{Michael J.\} and Mike BACHMANN and Nori MANDAKORO",

year = "2001",

month = jun,

doi = "10.1109/ACC.2001.945682",

language = "English",

isbn = "0780364953",

series = "Proceedings of the American Control Conference",

publisher = "Institute of Electrical and Electronics Engineers",

pages = "4466--4471",

booktitle = "Proceedings of the 2001 American Control Conference",

address = "United States",

note = "2001 American Control Conference, ACC 2001 ; Conference date: 25-06-2001 Through 27-06-2001",

}

VALLE, S, QIN, JJ, PIOVOSO, MJ, BACHMANN, M & MANDAKORO, N 2001, Extracting Fault Subspaces for Fault Identification of a Polyester Film Process. in Proceedings of the 2001 American Control Conference. Proceedings of the American Control Conference, Institute of Electrical and Electronics Engineers, pp. 4466-4471, 2001 American Control Conference, ACC 2001, Arlington, Virginia, United States, 25/06/01. https://doi.org/10.1109/ACC.2001.945682

Extracting Fault Subspaces for Fault Identification of a Polyester Film Process. / VALLE, Sergio; QIN, Joe J.; PIOVOSO, Michael J. et al.
Proceedings of the 2001 American Control Conference. Institute of Electrical and Electronics Engineers, 2001. p. 4466-4471 (Proceedings of the American Control Conference).

Research output: Book Chapters | Papers in Conference Proceedings › Conference paper (refereed) › Referred Conference Paper › peer-review

TY - GEN

T1 - Extracting Fault Subspaces for Fault Identification of a Polyester Film Process

AU - VALLE, Sergio

AU - QIN, Joe J.

AU - PIOVOSO, Michael J.

AU - BACHMANN, Mike

AU - MANDAKORO, Nori

PY - 2001/6

Y1 - 2001/6

N2 - Although fault detection has been well studied in process monitoring under stationary conditions, the identification of faults in chemical processes is a difficult task. In this paper, we present a new approach in the use of a fault identification index to identify faults based on fault directions extracted from abnormal data using singular value decomposition. The proposed method is demonstrated on an industrial polyester film process which is characterized by frequent set-point changes and multiple grade changes. Further, a comparison between the fault identification index and the contribution plot method is given.

AB - Although fault detection has been well studied in process monitoring under stationary conditions, the identification of faults in chemical processes is a difficult task. In this paper, we present a new approach in the use of a fault identification index to identify faults based on fault directions extracted from abnormal data using singular value decomposition. The proposed method is demonstrated on an industrial polyester film process which is characterized by frequent set-point changes and multiple grade changes. Further, a comparison between the fault identification index and the contribution plot method is given.

UR - https://www.scopus.com/pages/publications/0034842247

U2 - 10.1109/ACC.2001.945682

DO - 10.1109/ACC.2001.945682

M3 - Conference paper (refereed)

SN - 0780364953

T3 - Proceedings of the American Control Conference

SP - 4466

EP - 4471

BT - Proceedings of the 2001 American Control Conference

PB - Institute of Electrical and Electronics Engineers

T2 - 2001 American Control Conference, ACC 2001

Y2 - 25 June 2001 through 27 June 2001

ER -

Extracting Fault Subspaces for Fault Identification of a Polyester Film Process

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