Abstract
We present a novel method for automatic vanishing point detection based on primal and dual point alignment detection. The very same point alignment detection algorithm is used twice: First in the image domain to group line segment endpoints into more precise lines. Second, it is used in the dual domain where converging lines become aligned points. The use of the recently introduced PClines dual spaces and a robust point alignment detector leads to a very accurate algorithm. Experimental results on two public standard datasets show that our method significantly advances the state-of-the-art in the Manhattan world scenario, while producing state-of-the-art performances in non-Manhattan scenes.
| Original language | English |
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| Title of host publication | Proceedings of the 2014 IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
| Publisher | IEEE |
| Pages | 509-515 |
| Number of pages | 7 |
| ISBN (Electronic) | 9781479951185 |
| DOIs | |
| Publication status | Published - 2014 |
| Externally published | Yes |
| Event | 27th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014 - Columbus, United States Duration: 23 Jun 2014 → 28 Jun 2014 |
Publication series
| Name | Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
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| ISSN (Print) | 1063-6919 |
Conference
| Conference | 27th IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2014 |
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| Country/Territory | United States |
| City | Columbus |
| Period | 23/06/14 → 28/06/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.
Keywords
- 2d point alignments
- line-to-point mapping
- vanishing point detection