GLAD: A Global-to-Local Anomaly Detector

  • Aitor ARTOLA*
  • , Yannis KOLODZIEJ
  • , Jean-Michel MOREL
  • , Thibaud EHRET
  • *Corresponding author for this work

Research output: Book Chapters | Papers in Conference ProceedingsConference paper (refereed)Researchpeer-review

Abstract

Learning to detect automatic anomalies in production plants remains a machine learning challenge. Since anomalies by definition cannot be learned, their detection must rely on a very accurate "normality model". To this aim, we introduce here a global-to-local Gaussian model for neural network features, learned from a set of normal images. This probabilistic model enables unsupervised anomaly detection. A global Gaussian mixture model of the features is first learned using all available features from normal data. This global Gaussian mixture model is then localized by an adaptation of the K-MLE algorithm, which learns a spatial weight map for each Gaussian. These weights are then used instead of the mixture weights to detect anomalies. This method enables precise modeling of complex data, even with limited data. Applied on WideResnet50-2 features, our approach outperforms the previous state of the art on the MVTec dataset, particularly on the object category. It is robust to perturbations that are frequent in production lines, such as imperfect alignment, and is on par in terms of memory and computation time with the previous state of the art.
Original languageEnglish
Title of host publicationProceedings: 2023 IEEE Winter Conference on Applications of Computer Vision, WACV 2023
PublisherIEEE
Pages5490-5499
Number of pages10
ISBN (Electronic)9781665493468
ISBN (Print)9781665493475
DOIs
Publication statusPublished - 2023
Externally publishedYes
Event2023 IEEE/CVF Winter Conference on Applications of Computer Vision - Waikoloa, United States
Duration: 2 Jan 20237 Jan 2023

Conference

Conference2023 IEEE/CVF Winter Conference on Applications of Computer Vision
Country/TerritoryUnited States
CityWaikoloa
Period2/01/237/01/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

Keywords

  • Algorithms: Image recognition and understanding (object detection, categorization, segmentation)
  • and algorithms (including transfer, low-shot, semi-, self-, and un-supervised learning)
  • formulations
  • Machine learning architectures

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