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Maximizing Fault Detectability with Closed-Loop Control
Zhijie SUN
,
S. Joe QIN
Research output
:
Journal Publications
›
Journal Article (refereed)
›
peer-review
Overview
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Engineering
Detectability
66%
Minimum Variance
66%
Closed Loop Control
66%
Process Variation
66%
Sufficient Condition
33%
Simulation Example
33%
Research
33%
Assuming
33%
Computer Science
Closed-Loop Control
66%
Process Variation
66%
Sufficient Condition
33%
Process Monitoring
33%
Fault Detection
33%
Simulation Example
33%
Control
33%
Modeling
33%
Physics
Controllers
100%
Impact
33%
Variations
33%
Matrix
33%