Abstract
State-of-the-art industrial visual anomaly detection now relies on modeling the distribution of pre-trained neural network features. To this goal, most of the work has focused on how to model features of normal data and the choice of the pre-trained network. The current trend is to use a network pre-trained using self-supervised contrastive learning so that the same network can be used for all possible downstream applications. However, this also means that the network is object and task agnostic, meaning that features are very generic and not optimized with the detection model. In this paper, we propose to look at how to specialize features for a given application so as to improve performance and propose a fine-tuning process taking advantage of the differentiability of some popular models. This fine-tuning is performed following a contrastive learning framework meaning that no real anomalies are necessary during the process. We demonstrate the improvement on both localization and quality of detection on the MVtec dataset.
| Original language | English |
|---|---|
| Title of host publication | Proceedings: 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2024 |
| Publisher | IEEE |
| Pages | 3981-3991 |
| Number of pages | 11 |
| ISBN (Electronic) | 9798350365474 |
| ISBN (Print) | 9798350365481 |
| DOIs | |
| Publication status | Published - 2024 |
| Externally published | Yes |
| Event | 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops - Seattle, United States Duration: 17 Jun 2024 → 18 Jun 2024 |
Publication series
| Name | IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops |
|---|---|
| ISSN (Print) | 2160-7508 |
| ISSN (Electronic) | 2160-7516 |
Workshop
| Workshop | 2024 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops |
|---|---|
| Country/Territory | United States |
| City | Seattle |
| Period | 17/06/24 → 18/06/24 |
Bibliographical note
Publisher Copyright:© 2024 IEEE.
Keywords
- anomaly detection
- contrastive learning
- self-supervised learning
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