TY - GEN
T1 - Online Dropout Detection in Subcutaneously Implanted Continuous Glucose Monitoring
AU - SHEN, Quan
AU - QIN, S. Joe
AU - DONIGER, Ken J.
PY - 2010/6
Y1 - 2010/6
N2 - Continuous glucose monitoring (CGM) can inform diabetic people of the status of their glucose and warn of actual or impending hypo- or hyperglycemia. In the past decades, biosensors have been developed for CGM, among which the subcutaneously implanted glucose monitors are of much interest because they are less painful while quickly measure the critical glucose concentrations in the body. Experiments of these monitors show that there are occasionally spurious dropouts which do not reflect the true glucose level and will cause problems in glucose calibration. In this paper, a discrete wavelet transform (DWT) based online detector is proposed to detect dropouts for a single glucose sensor signal. Its effectiveness is demonstrated by both experimental data from the non-diabetic pig and clinical data from people. © 2010 AACC.
AB - Continuous glucose monitoring (CGM) can inform diabetic people of the status of their glucose and warn of actual or impending hypo- or hyperglycemia. In the past decades, biosensors have been developed for CGM, among which the subcutaneously implanted glucose monitors are of much interest because they are less painful while quickly measure the critical glucose concentrations in the body. Experiments of these monitors show that there are occasionally spurious dropouts which do not reflect the true glucose level and will cause problems in glucose calibration. In this paper, a discrete wavelet transform (DWT) based online detector is proposed to detect dropouts for a single glucose sensor signal. Its effectiveness is demonstrated by both experimental data from the non-diabetic pig and clinical data from people. © 2010 AACC.
UR - http://www.scopus.com/inward/record.url?scp=77957816735&partnerID=8YFLogxK
U2 - 10.1109/acc.2010.5530788
DO - 10.1109/acc.2010.5530788
M3 - Conference paper (refereed)
SN - 9781424474264
T3 - Proceedings of the American Control Conference
SP - 4373
EP - 4378
BT - Proceedings of the 2010 American Control Conference
PB - Institute of Electrical and Electronics Engineers
T2 - 2010 American Control Conference, ACC 2010
Y2 - 30 June 2010 through 2 July 2010
ER -