Outage Analysis for OTFS-based Single User and Multi-User Transmissions

Ruoxi CHONG*, Shuangyang LI, Weijie YUAN*, Jinhong YUAN

*Corresponding author for this work

Research output: Book Chapters | Papers in Conference ProceedingsConference paper (refereed)Researchpeer-review

9 Citations (Scopus)

Abstract

Orthogonal time frequency space (OTFS) mod-ulation has been widely recognized as a promising waveform for future wireless networks. To shed light on the system de-sign, we study the outage performance of OTFS modulation over the high-mobility channels in comparison to the conventional orthogonal frequency-division multiplexing (OFDM) modulation, including both the single user transmission and the uplink multi-user transmission. After briefly reviewing the preliminaries of OTFS modulation, we commence on the study of the outage performance based on the closed-form expression of the achievable rates. Furthermore, we apply bounding techniques for the related outage derivation, in order to obtain insightful conclusions. Based on our derivations, we found that the OTFS modulation is robust against the severe Doppler effect induced by the high-mobility. Our numerical results demonstrated that OTFS modulation for both single user and multi-user transmissions enjoy a significantly better outage performance compared to the OFDM counterparts, where the outage curves are also consistent with our derived bounds.

Original languageEnglish
Title of host publication2022 IEEE International Conference on Communications Workshops, ICC Workshops 2022
PublisherIEEE
Pages746-751
Number of pages6
ISBN (Electronic)9781665426718
ISBN (Print)9781665426725
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event2022 IEEE International Conference on Communications Workshops, ICC Workshops 2022 - Seoul, Korea, Republic of
Duration: 16 May 202220 May 2022

Conference

Conference2022 IEEE International Conference on Communications Workshops, ICC Workshops 2022
Country/TerritoryKorea, Republic of
CitySeoul
Period16/05/2220/05/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

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