TY - GEN
T1 - Output-relevant fault reconstruction based on Total PLS
AU - LI, Gang
AU - ZHOU, Donghua
AU - QIN, S. Joe
PY - 2010/7
Y1 - 2010/7
N2 - Process monitoring is critical for efficient operations of industrial processes. When a fault occurs, relevant measured data are affected by the fault, which leads to poor quality of products consequently. This paper proposes a new output-relevant index for detecting faults that affect the output or quality, and studies the fault detectability based on total projection to latent structures (T-PLS). Given a fault subspace, fault-free data are reconstructed and the fault magnitude is estimated based on the new index. A simulation example is used to show the effectiveness of the proposed methods. © 2010 IEEE.
AB - Process monitoring is critical for efficient operations of industrial processes. When a fault occurs, relevant measured data are affected by the fault, which leads to poor quality of products consequently. This paper proposes a new output-relevant index for detecting faults that affect the output or quality, and studies the fault detectability based on total projection to latent structures (T-PLS). Given a fault subspace, fault-free data are reconstructed and the fault magnitude is estimated based on the new index. A simulation example is used to show the effectiveness of the proposed methods. © 2010 IEEE.
KW - Fault estimation
KW - Fault reconstruction
KW - Output-relevant fault detection
KW - Total PLS
UR - http://www.scopus.com/inward/record.url?scp=77958119676&partnerID=8YFLogxK
U2 - 10.1109/WCICA.2010.5554642
DO - 10.1109/WCICA.2010.5554642
M3 - Conference paper (refereed)
T3 - Proceedings of the World Congress on Intelligent Control and Automation (WCICA)
SP - 1718
EP - 1722
BT - Proceedings of the 8th World Congress on Intelligent Control and Automation
T2 - 8th World Congress on Intelligent Control and Automation (WCICA 2010)
Y2 - 6 July 2010 through 9 July 2010
ER -