TY - GEN
T1 - Quality-Relevant Fault Detection of Nonlinear Processes based on Kernel Concurrent Canonical Correlation Analysis
AU - ZHU, Qinqin
AU - LIU, Qiang
AU - QIN, S. Joe
PY - 2017/5
Y1 - 2017/5
N2 - Canonical correlation analysis (CCA) has been used for concurrent quality and process monitoring to extract multidimensional correlation structure between process and quality variables. In this paper, a new kernel concurrent CCA (KCCCA) algorithm is proposed for quality-relevant nonlinear process monitoring, which decomposes the original space into five subspaces, including correlation subspace, quality-principal subspace, quality-residual subspace, process-principal subspace and process-residual subspace. The proposed KCCCA considers the nonlinearity in both process and quality variables, and incorporates a regularization term as well for numerical robustness. In the case studies, the Tennessee Eastman process is employed to demonstrate the effectiveness of the proposed KCCCA.
AB - Canonical correlation analysis (CCA) has been used for concurrent quality and process monitoring to extract multidimensional correlation structure between process and quality variables. In this paper, a new kernel concurrent CCA (KCCCA) algorithm is proposed for quality-relevant nonlinear process monitoring, which decomposes the original space into five subspaces, including correlation subspace, quality-principal subspace, quality-residual subspace, process-principal subspace and process-residual subspace. The proposed KCCCA considers the nonlinearity in both process and quality variables, and incorporates a regularization term as well for numerical robustness. In the case studies, the Tennessee Eastman process is employed to demonstrate the effectiveness of the proposed KCCCA.
UR - http://www.scopus.com/inward/record.url?scp=85027051459&partnerID=8YFLogxK
U2 - 10.23919/ACC.2017.7963795
DO - 10.23919/ACC.2017.7963795
M3 - Conference paper (refereed)
SN - 9781509045839
T3 - Proceedings of the American Control Conference
SP - 5404
EP - 5409
BT - 2017 American Control Conference (ACC)
PB - Institute of Electrical and Electronics Engineers
T2 - 2017 American Control Conference, ACC 2017
Y2 - 24 May 2017 through 26 May 2017
ER -