TY - GEN
T1 - Reconstruction-based Contribution for Process Monitoring with Kernel Principal Component Analysis
AU - ALCALA, Carlos F.
AU - QIN, S. Joe
PY - 2010/6
Y1 - 2010/6
N2 - This paper presents a new method for fault diagnosis based on kernel principal component analysis (KPCA). The proposed method uses reconstruction-based contributions (RBC) to diagnose simple and complex faults in nonlinear principal component models based on KPCA. Similar to linear PCA, a combined index, based on the weighted combination of the Hotelling's T2 and SPE indices, is proposed. Control limits for these fault detection indices are proposed using second order moment approximation. The proposed fault detection and diagnosis scheme is tested with a simulated CSTR process where simple and complex faults are introduced. The simulation results show that the proposed fault detection and diagnosis methods are efective for KPCA. © 2010 AACC.
AB - This paper presents a new method for fault diagnosis based on kernel principal component analysis (KPCA). The proposed method uses reconstruction-based contributions (RBC) to diagnose simple and complex faults in nonlinear principal component models based on KPCA. Similar to linear PCA, a combined index, based on the weighted combination of the Hotelling's T2 and SPE indices, is proposed. Control limits for these fault detection indices are proposed using second order moment approximation. The proposed fault detection and diagnosis scheme is tested with a simulated CSTR process where simple and complex faults are introduced. The simulation results show that the proposed fault detection and diagnosis methods are efective for KPCA. © 2010 AACC.
UR - http://www.scopus.com/inward/record.url?scp=77957816335&partnerID=8YFLogxK
U2 - 10.1109/acc.2010.5531315
DO - 10.1109/acc.2010.5531315
M3 - Conference paper (refereed)
SN - 9781424474264
T3 - Proceedings of the American Control Conference
SP - 7022
EP - 7027
BT - Proceedings of the 2010 American Control Conference
PB - Institute of Electrical and Electronics Engineers
T2 - 2010 American Control Conference, ACC 2010
Y2 - 30 June 2010 through 2 July 2010
ER -