Temperature dependence of the Raman spectra of Bi2Te3 and Bi0.5Sb1.5Te3 thermoelectric films

Duanhui LI; Liangliang LI; Da-Wei LIU; Jing-Feng LI

doi:10.1002/pssr.201206149

Temperature dependence of the Raman spectra of Bi₂Te₃ and Bi_0.5Sb_1.5Te₃ thermoelectric films

Duanhui LI
, Liangliang LI^*
, Da-Wei LIU
, Jing-Feng LI

^*Corresponding author for this work

Research output: Journal Publications › Journal Article (refereed) › peer-review

29 Citations (Scopus)

Abstract

The temperature dependence of the Raman spectra of Bi₂Te₃ and Bi_0.5Sb_1.5Te₃ thermoelectric films was investigated. The temperature coefficients of the E_g(2) peak positions were determined as -0.0137 cm^-1/°C and -0.0156 cm^-1/°C, respectively. The thermal expansion of the crystal caused a linear shift of the Raman peak induced by the temperature change. Based on the linear relation, a reliable and noninvasive micro-Raman scattering method was shown to measure the thermal conductivity of the thermoelectric films. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Original language	English
Pages (from-to)	268-270
Number of pages	3
Journal	Physica Status Solidi - Rapid Research Letters
Volume	6
Issue number	6
Early online date	10 May 2012
DOIs	https://doi.org/10.1002/pssr.201206149
Publication status	Published - Jun 2012
Externally published	Yes

Funding

This work was supported in part by NSFC (Grant No. 51102149) and Tsinghua University Initiative Scientific Research Program.

Keywords

Bi 2Te 3
Raman spectroscopy
Thermal conductivity
Thermal expansion
Thermoelectric materials
Thin films

Access to Document

10.1002/pssr.201206149

Cite this

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title = "Temperature dependence of the Raman spectra of Bi2Te3 and Bi0.5Sb1.5Te3 thermoelectric films",

abstract = "The temperature dependence of the Raman spectra of Bi2Te3 and Bi0.5Sb1.5Te3 thermoelectric films was investigated. The temperature coefficients of the Eg(2) peak positions were determined as -0.0137 cm-1/°C and -0.0156 cm-1/°C, respectively. The thermal expansion of the crystal caused a linear shift of the Raman peak induced by the temperature change. Based on the linear relation, a reliable and noninvasive micro-Raman scattering method was shown to measure the thermal conductivity of the thermoelectric films. {\textcopyright} 2012 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim.",

keywords = "Bi 2Te 3, Raman spectroscopy, Thermal conductivity, Thermal expansion, Thermoelectric materials, Thin films",

author = "Duanhui LI and Liangliang LI and Da-Wei LIU and Jing-Feng LI",

year = "2012",

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doi = "10.1002/pssr.201206149",

language = "English",

volume = "6",

pages = "268--270",

journal = "Physica Status Solidi - Rapid Research Letters",

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T1 - Temperature dependence of the Raman spectra of Bi2Te3 and Bi0.5Sb1.5Te3 thermoelectric films

AU - LI, Duanhui

AU - LI, Liangliang

AU - LIU, Da-Wei

AU - LI, Jing-Feng

PY - 2012/6

Y1 - 2012/6

N2 - The temperature dependence of the Raman spectra of Bi2Te3 and Bi0.5Sb1.5Te3 thermoelectric films was investigated. The temperature coefficients of the Eg(2) peak positions were determined as -0.0137 cm-1/°C and -0.0156 cm-1/°C, respectively. The thermal expansion of the crystal caused a linear shift of the Raman peak induced by the temperature change. Based on the linear relation, a reliable and noninvasive micro-Raman scattering method was shown to measure the thermal conductivity of the thermoelectric films. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

AB - The temperature dependence of the Raman spectra of Bi2Te3 and Bi0.5Sb1.5Te3 thermoelectric films was investigated. The temperature coefficients of the Eg(2) peak positions were determined as -0.0137 cm-1/°C and -0.0156 cm-1/°C, respectively. The thermal expansion of the crystal caused a linear shift of the Raman peak induced by the temperature change. Based on the linear relation, a reliable and noninvasive micro-Raman scattering method was shown to measure the thermal conductivity of the thermoelectric films. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

KW - Bi 2Te 3

KW - Raman spectroscopy

KW - Thermal conductivity

KW - Thermal expansion

KW - Thermoelectric materials

KW - Thin films

UR - https://www.scopus.com/pages/publications/84862266505

U2 - 10.1002/pssr.201206149

DO - 10.1002/pssr.201206149

M3 - Journal Article (refereed)

AN - SCOPUS:84862266505

SN - 1862-6254

VL - 6

SP - 268

EP - 270

JO - Physica Status Solidi - Rapid Research Letters

JF - Physica Status Solidi - Rapid Research Letters

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