Abstract
Nanocrystalline n-type bismuth telluride (Bi2Te3) thin films doped with lead (Pb) were deposited by radiofrequency magnetron sputtering. The effects of Pb doping on the carrier concentration and the thermoelectric properties of the Bi2Te3 thin film were investigated. Optimization of the carrier concentration significantly increased the Seebeck coefficient of the Bi2Te3 film and reduced the carrier thermal conductivity. These phenomena contributed to the enhancement of the thermoelectric properties of the Bi2Te3 film. Power factors of 2.50 and 2.15 mW K-2 m-1 were achieved at 473 K for the as-deposited and annealed Bi2Te3 films with Pb doping concentration of 0.38 at.%, respectively. The experimental data demonstrate that Pb doping can effectively control the carrier concentration of the n-type Bi2Te3 film. The Pb-doped Bi2Te3 film is a promising material for thermoelectric microdevices. © 2013 Elsevier B.V. All rights reserved.
Original language | English |
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Pages (from-to) | 362-367 |
Number of pages | 6 |
Journal | Journal of the Less-Common Metals |
Volume | 590 |
Early online date | 21 Dec 2013 |
DOIs | |
Publication status | Published - 25 Mar 2014 |
Externally published | Yes |
Funding
This work was supported in part by the National Natural Science Foundation of China (Grant No. 51102149), the National Basic Research Program of China (Grant No. 2013CB632504), the National High Technology Research and Development Program (Grant No. 2012AA051104), and the Scientific Research Foundation for the Returned Overseas Chinese Scholars, State Education Ministry.
Keywords
- Magnetron sputtering
- Pb doping
- Thermoelectric properties
- Thin films