Abstract
Multivariate statistical process monitoring (MSPM) is an efficient data-driven fault detection and diagnosis approach for complex industrial processes. Partial least squares or projection to latent structures (PLS) is one of the latent projection structures used in MSPM, which uses process data X and quality data Y together. In this paper, we discuss a new fault diagnosis approach based on total projection to latent structures (T-PLS). Four kinds of monitoring statistics are used in T-PLS, and a new definition of variable contributions to T2 of PLS is proposed. Then, definitions of variable contributions to all statistics are derived to identify the faults. Control limits for contribution plots are calculated to identify whether a variable is in abnormal situation or not. Further, the proposed method separates the identified variables into faulty variables related to Y and unrelated to Y more clearly than conventional method. A case study on Tennessee Eastman process (TEP) indicates the efficiency of the proposed approach.
Original language | English |
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Pages (from-to) | 759-765 |
Number of pages | 7 |
Journal | Zidonghua Xuebao/ Acta Automatica Sinica |
Volume | 35 |
Issue number | 6 |
DOIs | |
Publication status | Published - 20 Jun 2009 |
Externally published | Yes |
Bibliographical note
Supported by National Basic Research Program of China (973 Program) (2009CB320602), National Natural Science Foundation of China (60721003, 60736026), and Changjiang Professorship by Ministry of Education of P. R. China.Keywords
- Contribution plots
- Data-driven
- Fault diagnosis
- Total projection to latent structures (T-PLS)
Fingerprint
Dive into the research topics of 'Total PLS Based Contribution Plots for Fault Diagnosis'. Together they form a unique fingerprint.Prizes
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Best Paper Award of 2011 by Acta Automatica Sinica (Non-LU)
LI, G. (Recipient), QIN, S. J. (Recipient), JI, Y. (Recipient) & ZHOU, D. (Recipient), 2009
Prize: Prize (Non-CDCF)