Using negative correlation to evolve fault-tolerant circuits

Thorsten SCHNIER, Xin YAO

Research output: Book Chapters | Papers in Conference ProceedingsConference paper (refereed)Researchpeer-review

24 Citations (Scopus)


In this paper, we show how artificial evolution can be used to improve the fault-tolerance of electronic circuits. We show that evolution is able to improve the fault tolerance of a digital circuit, given a known fault model. Evolution is also able to create sets of different circuits that, when combined into an ensemble of circuits, have reduced correlation in their fault pattern, and therefore improved fault tolerance. An important part of the algorithm used to create the circuits is a measure of the correlation between the fault patterns of different circuits. Using this measure in the fitness, the circuits evolve towards different, highly fault-tolerant circuits. The measure also proves very useful for fitness sharing purposes. We have evolved a number of circuits for a simple 2×3 multiplier problem, and use these to demonstrate the performance under different simulated fault models. © Springer-Verlag Berlin Heidelberg 2003.
Original languageEnglish
Title of host publicationEvolvable Systems: From Biology to Hardware: 5th International Conference, ICES 2003, Trondheim, Norway, March 17-20, 2003, Proceedings
EditorsAAndy M. TYRRELL, Pauline C. HADDOW, Jim TORRESEN
PublisherSpringer Berlin Heidelberg
Number of pages12
ISBN (Electronic)9783540365532
ISBN (Print)9783540007302
Publication statusPublished - 2003
Externally publishedYes
Event5th International Conference on Evolvable Systems, ICES 2003 - Trondheim, Norway
Duration: 17 Mar 200320 Mar 2003

Publication series

NameLecture Notes in Computer Science
PublisherSpringer Berlin, Heidelberg
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349


Conference5th International Conference on Evolvable Systems, ICES 2003


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