Wettability of Sn-Bi and Sn-Ag-Cu lead-free solder pastes on electroplated Co-P films

Donghua YANG, Nianduan LU, Liangliang LI

Research output: Book Chapters | Papers in Conference ProceedingsConference paper (refereed)Researchpeer-review

8 Citations (Scopus)

Abstract

The wettability of the molten lead-free solder on the substrate is an important property for the lead-free solder joints in electronic products. In this paper, we investigated the wettability of lead-free solder pastes on electroplated Co-P films. We measured the contact angles of one kind of Sn-Bi and two kinds of Sn-Ag-Cu (SAC305 and SAC387) solder pastes on the Co-P films with nanocrystalline, amorphous and mixed structures and studied the dependence of the contact angles of the molten solders on the microstructure of the Co-P film. The experimental data showed that in general the amorphous Co-P film with a large phosphorous content was favorable for all three solder pastes in terms of wettability. SAC305 had a contact angle less than 10° on the amorphous Co-P film and Sn-Bi had a contact angle of about 20° on it. Although SAC387 spread out completely on the amorphous and mixed Co-P films, Sn in SAC387 diffused quickly into the Co-P films and even penetrated the films. In addition, we observed the cross-sections of the solder joints, studied the interfacial reaction between the solders and the Co-P films by scanning electron microscopy and explained the variation of the contact angles of the solders on different Co-P films.

Original languageEnglish
Title of host publication2013 IEEE 63rd Electronic Components and Technology Conference, ECTC 2013
PublisherIEEE
Pages1686-1691
Number of pages6
ISBN (Print)9781479902330
DOIs
Publication statusPublished - 2013
Externally publishedYes
Event2013 IEEE 63rd Electronic Components and Technology Conference, ECTC 2013 - Las Vegas, NV, United States
Duration: 28 May 201331 May 2013

Publication series

NameProceedings - Electronic Components and Technology Conference
ISSN (Print)0569-5503

Conference

Conference2013 IEEE 63rd Electronic Components and Technology Conference, ECTC 2013
Country/TerritoryUnited States
CityLas Vegas, NV
Period28/05/1331/05/13

Keywords

  • Co-P film
  • Lead-free solder
  • Sn-Ag-Cu
  • Sn-Bi
  • Wettability

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